ีV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMS

Ivan๎-Frankivsk, May, 11-16, 2015, page 347

Reconstruction of Residual Deformation Field from Moiré Patterns in the X-ray Interferometry

Fodchuk I.M., Novikov S.M., Yaremchuk I.V., Struk Ya.M.

 REFERENCE

1. Raransky M.D., Shafraniuk V.P., Fodchuk I.M. // Sov. Metallofizika. – 1985. – Vol. 7, No.5. – P.63.
2. Fodchuk I.M., Raransky M.D. // J. Phys. D: Applied Physics. – 2003. – Vol.36. – P.A55.