ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMS
Ivanî-Frankivsk, May, 11-16, 2015, page 253
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ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMSIvanî-Frankivsk, May, 11-16, 2015, page 253 |
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The Influence of Obtained Conditions for Fundamental Absorption Edge in Y2O3 Thin FilmsAntonyuk V.G., Bordun ².Î., Kukharskyy I.Yo., Polovynko I.I.
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