ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMSIvanî-Frankivsk, May, 11-16, 2015, page 175 |
Compositional Investigations of the As-Se Nanolayers Using X-ray Photoelectron SpectroscopyKondrat O. , Holomb R., Popovich N., Tsud N., Mitsa V.REFERENCE1. V.M. Lyubin, J. Non-Cryst. Solids 97-98 (1987) 47-54. |