ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMS
Ivanî-Frankivsk, May, 11-16, 2015, page 335
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ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMSIvanî-Frankivsk, May, 11-16, 2015, page 335 |
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Dosimetry Application of the YAlO3:Mn Based MaterialsZhydachevskii Ya., Luchechko A., Martynyuk N., Morgun A., Ubizskii S., Chumak V., Berkowski M., Suchocki A.
REFERENCE1. Ya. Zhydachevskii, A. Suchocki, M. Berkowski, P. Bilski, S. Warchol, Radiat. Meas. 45 (2010) 516–518.2. Ya. Zhydachevskii, M. Berkowski, S. Warchol, A. Suchocki, Radiat. Meas. 46 (2011) 494–497. |
