ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMS

Ivanî-Frankivsk, May, 11-16, 2015, page 315

Characterization of Zn(Mn)Se/GaAs(001) Layers by Multi-Beam X-Ray Diffraction

Borcha M., Fodchuk I., Baidakova M., Klimko G., Sedova I., Sokolov R., Sorokin S.,2Yagovkina M.

 REFERENCE

1. Chang S-L, Journal of Physics and Chemistry of Solids, 62, (2001), 1765.
2. Borcha M et al. (2009). Physica status solidi A 206, N 8, 1699.