ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMS

Ivanî-Frankivsk, May, 11-16, 2015, page 77

A Comparison of Methods for Determination of Schottky Barrier Height and Ideality Factor Regarding the Contacts Based on Broad-Band Semiconductors

Kudryk Ya.Ya., Shynkarenko V.V., Slipokurov V.S., Bigun R.I., Kudryk R.Ya.

 REFERENCE

1. V. Aubry, F. Meyer., J. Appl. Phys., 76(12), (1994), 7973.
2. K. Sarpatwari. Toward understanding the electrical properties of metal/semiconductor Schottky contacts. PhD Diss. Pennsylv. St. Univ. (2009).