ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMS

Ivanî-Frankivsk, May, 11-16, 2015, page 74

Doppler Broadening of Annihilation Line Study of Defect Structure in Advanced Optoelectronic Materials

Kavetskyy T.S.

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1. T. Kavetskyy, V. Tsmots, O. Šauša, A.L. Stepanov, Phys. Status Solidi C, 9(12), (2012), 2420.
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4. T.S. Kavetskyy, V.M. Tsmots, S.Ya. Voloshanska, O. Šauša, A.L. Stepanov, Abstracts of 6th International Scientific and Technical Conference “Sensor Electronics and Microsystem Technologies” (SEMST-6) (Odessa, Ukraine, 29 September - 3 October, 2014), 226. 5. T.S. Kavetskyy, O. Šauša, T. Petkova, V. Boev, P. Petkov, A.V. Kukhta, A.L. Stepanov, In book: NATO Science for Peace and Security Series - A: Chemistry and Biology, Chapter 9 “Nanoscience Advances in CBRN Agents Detection, Information and Energy Security” (P. Petkov, D. Tsiulyanu, C. Popov, W. Kulisch, eds.), Berlin: Springer, (2015), 85.