ÕV INTERNATIONAL CONFERENCE ON PHYSICS AND TECHNOLOGY OF THIN FILMS AND NANOSYSTEMSIvanî-Frankivsk, May, 11-16, 2015, page 72 |
The Features of Cleavages in Au–Ti–Pd–n+–n-Si Ohmic ContactsBelyaev A.E., Boltovets N.S., Vinogradov À.Î., Pilipenko V.A., Petlitskaya T.V., Solodukha V.A., Konakova R.V., Kudryk Ya.Ya., Korostinskaya T.V.REFERENCE |